Gigamax Technologies
 
 

Solutions meet the new SATA II compliance specifications.

Wavecrest SATA Solution:

SIA 3400D

GigaView Software Page

Characterization & Analysis Tools Datasheet

Multi Rate Hardware Clock Recovery Option

Technical Resources:

Serial ATA Product Sheet

Download the Serial ATA Application Note

Quick Reference Guide

Outside Resources:
www.serialATA.org
Comprehensive Analysis from the Leaders in Signal Integrity

The transition from an ATA bus to 1.5 and 3.0Gbps Serial ATA (SATA & SATA II) data brings on a whole new level of signal integrity design and system challenges. At these high data rates, signal integrity becomes the most critical test for determining overall performance and interoperability. Wavecrest instruments have offered high-speed test capabilities to design engineers for over 10 years. This experience enables us to provide you with all the compliance and diagnostic tools for any SATA or SATA II application. The Wavecrest solution provides both timing and amplitude compliance measurements in any environment, system or IC. Compliance tests can be completed in seconds with a simple pass/fail indication for each test parameter. It is the most comprehensive and easy to use signal integrity test solution on the market today.

 

Detailed Diagnostics for Timing and Amplitude Measurements

Wavecrest is the leader in signal integrity analysis because of the comprehensive diagnostic tools that take you beyond just making compliance measurements. The most time consuming part of signal integrity analysis is debug and characterization because determining and eliminating signal integrity problems is a lengthy process. With Wavecrest diagnostic tools you can shorten the debug and characterization time considerably so you can get your product to market faster. A few of the diagnostic capabilities include:

Accurately determine device performance by quantifying random and deterministic jitter components. Accurate performance characterization enables smaller test margins and higher product yield.

Quickly isolate and quantify unwanted deterministic jitter due to crosstalk and EMI with a spectral view of jitter.

Perform eye diagram analysis for a quick qualitative view of device performance.

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